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KCI
반도체 공정에서의 Wafer Map Image 분석 방법론
유영지; 안대웅; 박승환;
백준걸
Article
Issue Date
2015
Citation
대한산업공학회지, v.41, no.3, pp.267 - 274
Publisher
대한산업공학회
KCI
CCA를 통한 반도체 공정 변인들의 상관성 분석 : 웨이퍼검사공정의 전압과 불량결점수와의 관계를 중심으로
김승민;
백준걸
Article
Issue Date
2015
Citation
대한산업공학회지, v.41, no.6, pp.579 - 587
Publisher
대한산업공학회
KCI
다중공선성과 불균형분포를 가지는 공정데이터의 분류 성능 향상에 관한 연구
이채진; 박정술; 김준석;
백준걸
Article
Issue Date
2015
Citation
대한산업공학회지, v.41, no.1, pp.25 - 33
Publisher
대한산업공학회
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