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Comparative study of deep learning algorithms for atomic force microscopy image denoising

Jung, Hoichan; Han, Giwoong; Jung, Seong Jun; Han, Sung Won

ArticleIssue Date2022CitationMICRON, v.161PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCIESCOPUS

Draw-a-Deep Pattern: Drawing Pattern-Based Smartphone User Authentication Based on Temporal Convolutional Neural Network open access

Kim, Junhong; Kang, Pilsung

ArticleIssue Date2022CitationAPPLIED SCIENCES-BASEL, v.12, no.15PublisherMDPI

SCIESCOPUS

Explainable anomaly detection framework for predictive maintenance in manufacturing systems

Choi, Heejeong; Kim, Donghwa; Kim, Jounghee; Kim, Jina; Kang, Pilsung

ArticleIssue Date2022CitationAPPLIED SOFT COMPUTING, v.125PublisherELSEVIER

SCIESCOPUS

AGV dispatching algorithm based on deep Q-network in CNC machines environment

Chang, Kyuchang; Park, Seung Hwan; Baek, Jun-Geol

ArticleIssue Date2022CitationINTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING, v.35, no.6, pp.662 - 677PublisherTAYLOR & FRANCIS LTD

SCIESCOPUS

CRFormer: Complementary Reliability Perspective Transformer for Automotive Components Reliability Prediction Based on Claim Data open access

Park, Hyun Joon; Kim, Taehyeong; Kim, Young Seok; Min, Jinhong; Sung, Ki Woo; Han, Sung Won

ArticleIssue Date2022CitationIEEE ACCESS, v.10, pp.88457 - 88468PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

EM-LAST: Effective Multidimensional Latent Space Transport for an Unpaired Image-to-Image Translation With an Energy-Based Model open access

Han, Giwoong; Min, Jinhong; Han, Sung Won

ArticleIssue Date2022CitationIEEE ACCESS, v.10, pp.72839 - 72849PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESSCISCOPUS

Competing product service in an OEM supply chain with upstream module suppliers as service providers

Liu, Liping; Zhao, Lindu; Lee, Chulung

ArticleIssue Date2021CitationINTERNATIONAL TRANSACTIONS IN OPERATIONAL RESEARCH, v.28, no.6, pp.3364 - 3393PublisherWILEY

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