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평형점 주사탐침열현미경에 의한 그래핀과 기판 사이 열저항 계측

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dc.contributor.authorKWON, Oh Myoung-
dc.date.accessioned2021-08-29T18:30:29Z-
dc.date.available2021-08-29T18:30:29Z-
dc.date.created2021-04-22-
dc.date.issued2013-04-05-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/44717-
dc.publisher열물성학회-
dc.title평형점 주사탐침열현미경에 의한 그래핀과 기판 사이 열저항 계측-
dc.title.alternativeMeasuring the thermal contact resistance between graphene and insulating substrate by null-point scanning thermal microscope-
dc.typeConference-
dc.contributor.affiliatedAuthorKWON, Oh Myoung-
dc.identifier.bibliographicCitation한국 열물성 학회 2013 춘계 학술대회-
dc.relation.isPartOf한국 열물성 학회 2013 춘계 학술대회-
dc.relation.isPartOf한국 열물성 학회 2013 춘계 학술대회-
dc.citation.title한국 열물성 학회 2013 춘계 학술대회-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace서울-
dc.citation.conferenceDate2013-04-04-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (기계공학부)
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