Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Variability of 6T SRAM with Multi-Gate MOSFET for the Future Technology NodeVariability of 6T SRAM with Multi-Gate MOSFET for the Future Technology Node
- Alternative Title
- Variability of 6T SRAM with Multi-Gate MOSFET for the Future Technology Node
- Authors
- Ji-Woon Yang
- Issue Date
- 18-2월-2011
- Publisher
- 대한전자공학회
- Citation
- 제18회 한국반도체 학술대회
- Conference Name
- 제18회 한국반도체 학술대회
- Place
- KO
제주 해비치호텔
- Conference Date
- 2011-02-16
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.