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Study of degradation mechanism of organic thin film transistor during passivation processes with new attack-free materials
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hong MunPyo | - |
| dc.date.accessioned | 2021-08-29T22:49:05Z | - |
| dc.date.available | 2021-08-29T22:49:05Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2010-01-28 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/47381 | - |
| dc.publisher | the Society for Information Display (SID) | - |
| dc.subject | Organic Thin Film Transistor, Soluble Passivation, TFT Degradation | - |
| dc.title | Study of degradation mechanism of organic thin film transistor during passivation processes with new attack-free materials | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Hong MunPyo | - |
| dc.identifier.bibliographicCitation | International Thin-Film Transistor Conference 2010, pp.116 - 117 | - |
| dc.relation.isPartOf | International Thin-Film Transistor Conference 2010 | - |
| dc.relation.isPartOf | The Proceedings of the 6th International Thin-Film Transistor Conference | - |
| dc.citation.title | International Thin-Film Transistor Conference 2010 | - |
| dc.citation.startPage | 116 | - |
| dc.citation.endPage | 117 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.conferencePlace | Egret Himeji, Japan | - |
| dc.citation.conferenceDate | 2010-01-28 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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