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A Semiconductor Yields Prediction Using Stepwise Support Vector Machine
- Authors
- Jun-Geol Baek
- Issue Date
- 18-11월-2009
- Publisher
- IEEE
- Citation
- 2009 IEEE International Symposium on Assembly and Manufacturing, pp.130 - 136
- Conference Name
- 2009 IEEE International Symposium on Assembly and Manufacturing
- Place
- KO
Suwon, Korea
- Conference Date
- 2009-11-17
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