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Development of a Quantitative Nanoscale Thermal Conductivity Profiling Technique by the Removal of Influence due to Heat Transfer Through the Air
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KWON, Oh Myoung | - |
| dc.date.accessioned | 2021-08-30T03:36:42Z | - |
| dc.date.available | 2021-08-30T03:36:42Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2009-07-20 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/49722 | - |
| dc.publisher | American Society Of Mechanical Engineers | - |
| dc.subject | scanning thermal microscope, thermal conductivity, quantitative measurement, spatial resolution | - |
| dc.title | Development of a Quantitative Nanoscale Thermal Conductivity Profiling Technique by the Removal of Influence due to Heat Transfer Through the Air | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | KWON, Oh Myoung | - |
| dc.identifier.bibliographicCitation | ASME 2009 Summer Heat Transfer Conference | - |
| dc.relation.isPartOf | ASME 2009 Summer Heat Transfer Conference | - |
| dc.citation.title | ASME 2009 Summer Heat Transfer Conference | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Westin St. Francis Hotel, San Francisco, CA, USA | - |
| dc.citation.conferenceDate | 2009-07-19 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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Collections - College of Engineering > Department of Mechanical Engineering > 2. Conference Papers
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