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Residual Image Reduction Using Electric Field Shield Metal in Plastic Organic Light-Emitting Diode Display

Authors
Won, Do YoungManh-Cuong NguyenKim, Hyun MinTak, Nam KyunChoi, Jin HyungChoi, RinoMyoung, Jae-MinYoon, Ho Gyu
Issue Date
11월-2020
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
a-IGZO TFT; Residual Image; POLED; Polyimide Film; TCAD
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.11, pp.6884 - 6889
Indexed
SCIE
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
20
Number
11
Start Page
6884
End Page
6889
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/51897
DOI
10.1166/jnn.2020.18806
ISSN
1533-4880
Abstract
A plastic organic light-emitting diode display is a device that emits light in an organic layer in proportion to the amount of current applied from a thin film transistor, which constitutes a pixel. However, it was confirmed that the residual image was shown by the operation of the thin film transistor. To suppress residual image, the effect of electric field was studied in operation of a-IGZO thin film transistor. The a-IGZO thin film transistor, in which a polyimide film was used as a substrate, was applied as a driving thin film transistor for pixel circuits in a plastic organic light-emitting diode display, and the effect of the electric field behavior inside the film on residual images was studied. Residual images were strongly connection with the electric field distribution characteristics inside the polyimide substrate, and they were reduced by introducing an electric field shield metal layer in the a-IGZO thin film transistor. The correlation between residual image generation and the operation of the a-IGZO thin film transistor was further explained through technology computer-aided design simulation (Silvaco Group Inc.).
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Yoon, Ho Gyu
공과대학 (신소재공학부)
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