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Surface characteristics of sputtered Ta, Ti as barrier layer for copper deposition

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dc.contributor.authorBYUN, Dong Jin-
dc.date.accessioned2021-08-30T15:27:42Z-
dc.date.available2021-08-30T15:27:42Z-
dc.date.created2021-04-22-
dc.date.issued2008-11-07-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/53489-
dc.publisher한국재료학회-
dc.titleSurface characteristics of sputtered Ta, Ti as barrier layer for copper deposition-
dc.typeConference-
dc.contributor.affiliatedAuthorBYUN, Dong Jin-
dc.identifier.bibliographicCitation2008년도 한국재료학회 추계학술발표대회 및 제 15회 신소재 심포지엄-
dc.relation.isPartOf2008년도 한국재료학회 추계학술발표대회 및 제 15회 신소재 심포지엄-
dc.citation.title2008년도 한국재료학회 추계학술발표대회 및 제 15회 신소재 심포지엄-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2008-11-07-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (신소재공학부)
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