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Effects of the electronic threshold on the performance of the RPC system of the CMS experiment

Authors
Elmetenawee, W.Samalan, A.Tytgat, M.Zaganidis, N.Alves, G. A.Marujo, F.Torres Da Silva De Araujo, F.Da Costa, E. M.De Jesus Damiao, D.Nogima, H.Santoro, A.De Souza, S. FonsecaAleksandrov, A.Hadjiiska, R.Iaydjiev, P.Rodozov, M.Shopova, M.Sultanov, G.Bonchev, M.Dimitrov, A.Litov, L.Pavlov, B.Petkov, P.Petrov, A.Qian, S. J.Bernal, C.Cabrera, A.Fraga, J.Sarkar, A.Elsayed, S.Assran, Y.El Sawy, M.Mahmoud, M. A.Mohammed, Y.Combaret, C.Gouzevitch, M.Grenier, G.Laktineh, IMirabito, L.Shchablo, K.Bagaturia, ILomidze, D.Lomidze, IBhatnagar, VGupta, R.Kumari, P.Singh, J.Amoozegar, VBoghrati, B.Ebraimi, M.Ghasemi, R.Najafabadi, M. MohammadiZareian, E.Abbrescia, M.Aly, R.De Filippis, N.Gelmi, A.Iaselli, G.Leszki, S.Loddo, F.Margjeka, IPugliese, G.Ramos, D.Benussi, L.Bianco, S.Piccolo, D.Buontempo, S.Di Crescenzo, A.Fienga, F.De Lellis, G.Lista, L.Meola, S.Paolucci, P.Braghieri, A.Salvini, P.Montagna, P.Riccardi, C.Vitulo, P.Francois, B.Kim, T. J.Park, J.Choi, S. Y.Hong, B.Lee, KsGoh, J.Lee, H.Eysermans, J.Estrada, C. UribePedraza, ICastilla-Valdez, H.Sanchez-Hernandez, A.Mondragon Herrera, C. A.Perez Navarro, D. A.Ayala Sanchez, G. A.Carrillo, S.Vazquez, E.Radi, A.Ahmad, A.Asghar, IHoorani, H.Muhammad, S.Shah, M. A.Crotty, I
Issue Date
9월-2020
Publisher
IOP PUBLISHING LTD
Keywords
Gaseous detectors; Resistive-plate chambers
Citation
JOURNAL OF INSTRUMENTATION, v.15, no.9
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF INSTRUMENTATION
Volume
15
Number
9
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/53655
DOI
10.1088/1748-0221/15/09/C09025
ISSN
1748-0221
Abstract
Resistive Plate Chambers have a very important role for muon triggering both in the barrel and in the endcap regions of the CMS experiment at the Large Hadron Collider (LHC). In order to optimize their performance, it is of primary importance to tune the electronic threshold of the front-end boards reading the signals from these detectors. In this paper we present the results of a study aimed to evaluate the effects on the RPC efficiency, cluster size and detector intrinsic noise rate, of variations of the electronics threshold voltage.
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