GaN on Patterned N+ Ion Implanted Si

BYUN, Dong Jin

Detailed Information

Cited 0 time in webofscience

Cited 0 time in scopus

Metadata Downloads

GaN on Patterned N+ Ion Implanted Si

Authors: BYUN, Dong Jin

Issue Date: 23-10월-2008

Publisher: 한국물리학회

Citation: 2008년 한국물리학회 가을학술논문발표회 및 임시총회

URI: https://scholar.korea.ac.kr/handle/2021.sw.korea/54564

Conference Name: 2008년 한국물리학회 가을학술논문발표회 및 임시총회

Place: KO

Conference Date: 2008-10-23

Files in This Item: There are no files associated with this item.

Appears in Collections: College of Engineering > Department of Materials Science and Engineering > 2. Conference Papers

Show full item record

qrcode

Related Researcher

Researcher BYUN, Dong Jin photo

BYUN, Dong Jin: 공과대학 (신소재공학부)

Read more

Altmetrics

Total Views & Downloads

STATISTICS: Total View :8,876,405; Today View :38,843

RSS_1.0 RSS_2.0 ATOM_1.0

(02841) 서울특별시 성북구 안암로 14502-3290-1114

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Detailed Information

Related Researcher

Altmetrics

Total Views & Downloads

BROWSE