Improvement in conductance modulation linearity of artificial synapses based on NaNbO3 memristor
- Authors
- Woo, Jong-Un; Hwang, Hyun-Gyu; Park, Sung-Mean; Lee, Tae-Gon; Nahm, Sahn
- Issue Date
- 6월-2020
- Publisher
- ELSEVIER
- Keywords
- Neuromorphic computing; Oxide memristor; Oxygen vacancy filament; Bipolar resistive switching; Conductance modulation linearity; Synaptic plasticity
- Citation
- APPLIED MATERIALS TODAY, v.19
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED MATERIALS TODAY
- Volume
- 19
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/55095
- DOI
- 10.1016/j.apmt.2020.100582
- ISSN
- 2352-9407
- Abstract
- A crystalline NaNbO3 (NN) film was deposited on the TiN/SiO2/Si (T-S) substrate at 300 degrees C by using the pulsed laser deposition method. The NN film that was annealed at 300 degrees C under 5 Torr O-2 atmosphere displays a typical bipolar switching curve. Growth and dissociation of the oxygen vacancy filament is responsible for the switching property of this NN memristor. This NN memristor shows good biological synaptic properties, but displays a non-linear conductance modulation with the application of an identical pulse. The non-linear conductance modulation is related to the non-linear growth of the oxygen vacancy filament that is controlled by two growth mechanisms (the fast redox process and the slow oxygen ion diffusion process) with different growth rates. The NN memristor was annealed under 10 Torr N-2 atmosphere to increase the number of oxygen vacancies, and it displayed improved conductance modulation linearity. The filament in this NN film can be grown linearly and the redox process became the main growth mechanism. Therefore, the conductance modulation linearity can be improved by increasing the number of oxygen vacancies, and this method can be applied to other memristors. (C) 2020 Elsevier Ltd. All rights reserved.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.