Thermal Design and Batch Fabrication of Full SiO2 Probes for Sensitivity Improvement
DC Field | Value | Language |
---|---|---|
dc.contributor.author | KWON, Oh Myoung | - |
dc.date.accessioned | 2021-08-30T21:38:49Z | - |
dc.date.available | 2021-08-30T21:38:49Z | - |
dc.date.created | 2021-04-22 | - |
dc.date.issued | 2008-10-14 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/55126 | - |
dc.publisher | KSME & JSME | - |
dc.subject | Scanning Thermal Microscope, Thermoelectric Probe, Thermocouple | - |
dc.title | Thermal Design and Batch Fabrication of Full SiO2 Probes for Sensitivity Improvement | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | KWON, Oh Myoung | - |
dc.identifier.bibliographicCitation | The Seventh JSME-KSME Thermal and Fluids Engineering Conference, pp.H132 | - |
dc.relation.isPartOf | The Seventh JSME-KSME Thermal and Fluids Engineering Conference | - |
dc.relation.isPartOf | Proceeding of The Seventh JSME-KSME Thermal and Fluids Engineering Conference | - |
dc.citation.title | The Seventh JSME-KSME Thermal and Fluids Engineering Conference | - |
dc.citation.startPage | H132 | - |
dc.citation.conferencePlace | JA | - |
dc.citation.conferencePlace | Sapporo, Japan | - |
dc.citation.conferenceDate | 2008-10-13 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
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