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High-Fidelity, Sub-5 nm Patterns from High-chi Block Copolymer Films with Vapor-Deposited Ultrathin, Cross-Linked Surface-Modification Layers

Authors
Wang, Hyun SukOh, SeulaChoi, JunhwanJang, WontaeKim, Ki HyunArellano, Carlos LuisHuh, JuneBang, JoonaIm, Sung Gap
Issue Date
Feb-2020
Publisher
WILEY-V C H VERLAG GMBH
Keywords
block copolymer thin films; initiated chemical vapor deposition; microdomain orientation; sub-5 nm nano-patterns; top coat
Citation
MACROMOLECULAR RAPID COMMUNICATIONS, v.41, no.4
Indexed
SCIE
SCOPUS
Journal Title
MACROMOLECULAR RAPID COMMUNICATIONS
Volume
41
Number
4
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/57760
DOI
10.1002/marc.201900514
ISSN
1022-1336
Abstract
Despite their capability, sub-10 nm periodic nano-patterns formed by strongly segregating block copolymer (BCP) thin films cannot be easily oriented perpendicular to the substrate due to the huge surface energy differences of the constituent blocks. To produce perpendicular nano-patterns, the interfacial energies of both the substrate and free interfaces should be controlled precisely to induce non-preferential wetting. Unfortunately, high-performance surface modification layers are challenging to design, and different kinds of surface modification methods must be devised respectively for each neutral layer and top coat. Furthermore, conventional approaches, largely based on spin-coating processes, are highly prone to defect formation and may readily cause dewetting at sub-10 nm thickness. To date, these obstacles have hampered the development of high-fidelity, sub-5 nm BCP patterns. Herein, an all-vapor phase deposition approach initiated chemical vapor deposition is demonstrated to form 9-nm-thick, uniform neutral bottom layer and top coat with exquisite control of composition and thickness. These layers are employed in BCP films to produce perpendicular cylinders with a diameter of approximate to 4 nm that propagate throughout a BCP thickness of up to approximate to 60 nm, corresponding to five natural domain spacings of the BCP. Such a robust approach will serve as an advancement for the reliable generation of sub-10 nm nano-patterns.
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