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QUANTITATIVE SCANNING THERMAL MICROSCOPY WITH DOUBLE SCAN TECHNIQUE

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dc.contributor.authorKWON, Oh Myoung-
dc.date.accessioned2021-08-31T17:41:28Z-
dc.date.available2021-08-31T17:41:28Z-
dc.date.created2021-04-22-
dc.date.issued2008-01-08-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/59833-
dc.publisherASME-
dc.subjectSThM (Scanning Thermal Microscope), Thermoelectric probe, Nanoscale temperature, AFM-
dc.titleQUANTITATIVE SCANNING THERMAL MICROSCOPY WITH DOUBLE SCAN TECHNIQUE-
dc.typeConference-
dc.contributor.affiliatedAuthorKWON, Oh Myoung-
dc.identifier.bibliographicCitation2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008-
dc.relation.isPartOf2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008-
dc.relation.isPartOf2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008-
dc.citation.title2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008-
dc.citation.conferencePlaceCH-
dc.citation.conferencePlace타이난 대만-
dc.citation.conferenceDate2008-01-06-
dc.type.rimsCONF-
dc.description.journalClass1-
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