Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Improvement of Structural and Optical properties of GaN Epilayer Grown by Patterned ion ImplantationImprovement of Structural and Optical properties of GaN Epilayer Grown by Patterned ion Implantation
- Alternative Title
- Improvement of Structural and Optical properties of GaN Epilayer Grown by Patterned ion Implantation
- Authors
- BYUN, Dong Jin
- Issue Date
- 30-11월-2006
- Publisher
- The Institute of Electrical Engineers of Japan
- Citation
- INTERNATIONAL SYMPOSIUM ON DRY PROECESS(DPS 2006)
- Conference Name
- INTERNATIONAL SYMPOSIUM ON DRY PROECESS(DPS 2006)
- Place
- JA
Nagoya, Japan
- Conference Date
- 2006-11-29
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.