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A 1.6V 1.4Gbps/pin Consumer DRAM with Self-Dynamic Voltage Scaling Technique in 44nm CMOS Technology
- Authors
- KIM, Chulwoo
- Publisher
- IEEE
- Citation
- IEEE International Solid-State Circuits Conference
- Conference Name
- IEEE International Solid-State Circuits Conference
- Place
- US
- Conference Date
- 2011-02-20
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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