Optimization of structured illumination microscopy with designing and rotating a grid pattern using a spatial light modulator
- Authors
- Han, Jeong-Heon; Yoo, Nak-Won; Kang, Ji-Hoon; Ju, Byeong-Kwon; Park, Min-Chul
- Issue Date
- 9월-2019
- Publisher
- SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
- Keywords
- structured illumination microscopy; optimization; optical sectioning; spatial light modulator; three-dimensional measurement
- Citation
- OPTICAL ENGINEERING, v.58, no.9
- Indexed
- SCIE
SCOPUS
- Journal Title
- OPTICAL ENGINEERING
- Volume
- 58
- Number
- 9
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/63420
- DOI
- 10.1117/1.OE.58.9.094102
- ISSN
- 0091-3286
- Abstract
- Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations. (C) The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License.
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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