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electrical properties of Cu seed layer grown from Cu(dmamb)2

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dc.contributor.authorBYUN, Dong Jin-
dc.date.accessioned2021-09-01T14:19:18Z-
dc.date.available2021-09-01T14:19:18Z-
dc.date.created2021-04-22-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/65102-
dc.publisher경상대학교-
dc.titleelectrical properties of Cu seed layer grown from Cu(dmamb)2-
dc.typeConference-
dc.contributor.affiliatedAuthorBYUN, Dong Jin-
dc.identifier.bibliographicCitationinternational symposium on functional materials-
dc.relation.isPartOfinternational symposium on functional materials-
dc.citation.titleinternational symposium on functional materials-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2009-06-15-
dc.type.rimsCONF-
dc.description.journalClass1-
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공과대학 (신소재공학부)
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