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Electrical characterization of Ge2Sb2Te5 nano-pillars in 130nm diameter size using nanosphere lithography and conductive atomic force microscopy
- Authors
- Lee, Heon
- Publisher
- 경북대학교
- Citation
- 제 16회 한국 반도체 학술대회
- Conference Name
- 제 16회 한국 반도체 학술대회
- Place
- KO
- Conference Date
- 2009-02-18
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