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Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

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dc.contributor.authorPark, Sunjeong-
dc.contributor.authorKim, Hyun Woo-
dc.contributor.authorKim, Mi Hye-
dc.contributor.authorKim, Young Chan-
dc.contributor.authorBaek, In Hyung-
dc.contributor.authorJang, Kyu-Ha-
dc.contributor.authorKim, Eun-San-
dc.contributor.authorKim, Hongjoo-
dc.contributor.authorVinokurov, Nikolay A.-
dc.contributor.authorJeong, Young Uk-
dc.contributor.authorPark, Seong Hee-
dc.date.accessioned2021-09-01T14:52:35Z-
dc.date.available2021-09-01T14:52:35Z-
dc.date.created2021-06-19-
dc.date.issued2019-05-21-
dc.identifier.issn0168-9002-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/65388-
dc.description.abstractUltrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump-probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on T M-120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.titleMeasurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Eun-San-
dc.contributor.affiliatedAuthorPark, Seong Hee-
dc.identifier.doi10.1016/j.nima.2019.01.087-
dc.identifier.scopusid2-s2.0-85062148741-
dc.identifier.wosid000462142700025-
dc.identifier.bibliographicCitationNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.927, pp.194 - 201-
dc.relation.isPartOfNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT-
dc.citation.titleNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT-
dc.citation.volume927-
dc.citation.startPage194-
dc.citation.endPage201-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaNuclear Science & Technology-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryNuclear Science & Technology-
dc.relation.journalWebOfScienceCategoryPhysics, Nuclear-
dc.relation.journalWebOfScienceCategoryPhysics, Particles & Fields-
dc.subject.keywordAuthorRF deflector-
dc.subject.keywordAuthorElectron duration measurement-
dc.subject.keywordAuthorUltrashort bunch measurement-
dc.subject.keywordAuthorUltrafast electron diffraction system-
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