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Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector
- Authors
- Park, Sunjeong; Kim, Hyun Woo; Kim, Mi Hye; Kim, Young Chan; Baek, In Hyung; Jang, Kyu-Ha; Kim, Eun-San; Kim, Hongjoo; Vinokurov, Nikolay A.; Jeong, Young Uk; Park, Seong Hee
- Issue Date
- 21-5월-2019
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- RF deflector; Electron duration measurement; Ultrashort bunch measurement; Ultrafast electron diffraction system
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.927, pp.194 - 201
- Indexed
- SCIE
SCOPUS
- Volume
- 927
- Start Page
- 194
- End Page
- 201
- ISSN
- 0168-9002
- Abstract
- Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump-probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on T M-120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.
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Collections - Graduate School > Department of Accelerator Science > 1. Journal Articles
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