Electrical characteristic study of nano-scale phase change material using conductive atomic force microscopy

Lee, Heon

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Electrical characteristic study of nano-scale phase change material using conductive atomic force microscopy

Authors: Lee, Heon

Publisher: 대한금속재료학회

Citation: 2008 대한금속재료학회 추계학술대회

URI: https://scholar.korea.ac.kr/handle/2021.sw.korea/68004

Conference Name: 2008 대한금속재료학회 추계학술대회

Place: KO

Conference Date: 2008-10-24

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Appears in Collections: College of Engineering > Department of Materials Science and Engineering > 2. Conference Papers

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