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Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferogramsEnhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
- Alternative Title
- Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
- Authors
- Choi, Youngwoon
- Issue Date
- 3-2월-2020
- Publisher
- SPIE
- Citation
- SPIE Photonics West 2020
- Conference Name
- SPIE Photonics West 2020
- Place
- US
- Conference Date
- 2020-02-01
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Collections - Graduate School > Department of Bioengineering > 2. Conference Papers
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