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High Gain beta-Ga2O3 Solar-Blind Schottky Barrier Photodiodes via Carrier Multiplication Process

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dc.contributor.authorOh, Sooyeoun-
dc.contributor.authorKim, Hyoung Woo-
dc.contributor.authorKim, Jihyun-
dc.date.accessioned2021-09-02T04:04:51Z-
dc.date.available2021-09-02T04:04:51Z-
dc.date.created2021-06-19-
dc.date.issued2018-11-01-
dc.identifier.issn2162-8769-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/71895-
dc.description.abstractbeta-Ga2O3, which is a ultra-wide band-gap semiconductor, is an attractive material for next-generation solar-blind photodetectors. A high gain solar-blind Schottky barrier photodetector using an exfoliated single crystalline beta-Ga2O3 nano-layer was demonstrated by employing internal carrier multiplication process. Excellent spectral selectivity with high responsivity was obtained between UV-A and UV-C wavelengths with fast response/decay characteristics. The gain of our beta-Ga2O3 solar-blind PD was similar to 3.78 x 10(3) under the multiplication mode at the reverse bias of -60 V, where the peak electric field was estimated to be 4.3 MV/cm (equivalent to impact ionization coefficient of 5 x 10(3) cm(-1)). Compared with non-multiplication mode, outstanding photo-sensing performances were achieved under the multiplication mode, including a responsivity of 8.18 A/W, a photocurrent-to-dark-current ratio of similar to 10(3) and external quantum efficiency of similar to 4 x 10(3)%. High gain via carrier multiplication process in a beta-Ga2O3 photodiode proposes a new route toward high performance solar-blind deep-UV photodetectors. (c) 2018 The Electrochemical Society.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELECTROCHEMICAL SOC INC-
dc.subjectPHOTODETECTORS-
dc.titleHigh Gain beta-Ga2O3 Solar-Blind Schottky Barrier Photodiodes via Carrier Multiplication Process-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jihyun-
dc.identifier.doi10.1149/2.0151811jss-
dc.identifier.scopusid2-s2.0-85070110029-
dc.identifier.wosid000449086500001-
dc.identifier.bibliographicCitationECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.7, no.11, pp.Q196 - Q200-
dc.relation.isPartOfECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY-
dc.citation.titleECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY-
dc.citation.volume7-
dc.citation.number11-
dc.citation.startPageQ196-
dc.citation.endPageQ200-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusPHOTODETECTORS-
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