A SPICE model of silicon tunneling field-effect transistors
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Woo, Sola | - |
dc.contributor.author | Kim, Minsuk | - |
dc.contributor.author | Kim, Sangsig | - |
dc.date.accessioned | 2021-09-02T11:38:40Z | - |
dc.date.available | 2021-09-02T11:38:40Z | - |
dc.date.created | 2021-06-19 | - |
dc.date.issued | 2018-05-05 | - |
dc.identifier.issn | 0167-9317 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/75568 | - |
dc.description.abstract | In this study, we propose a precise model of silicon tunneling field-effect transistors (TFETs) by modifying the Kane-Sze tunneling formula. In our model, a reference device is calibrated by utilizing TCAD and SPICE simulation. Electrical parameters extracted in our TCAD simulation are applied to a SPICE model not only for adopting the off-state current of a p-i-n diode under a reverse bias state but also for developing the threshold voltage and electric field equations. Furthermore, a basic complementary TFET inverter is simulated to demonstrate the capabilities of our proposed model. (C) 2018 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | GATE | - |
dc.subject | FETS | - |
dc.title | A SPICE model of silicon tunneling field-effect transistors | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Sangsig | - |
dc.identifier.doi | 10.1016/j.mee.2018.01.028 | - |
dc.identifier.scopusid | 2-s2.0-85041456917 | - |
dc.identifier.wosid | 000428104900012 | - |
dc.identifier.bibliographicCitation | MICROELECTRONIC ENGINEERING, v.191, pp.66 - 71 | - |
dc.relation.isPartOf | MICROELECTRONIC ENGINEERING | - |
dc.citation.title | MICROELECTRONIC ENGINEERING | - |
dc.citation.volume | 191 | - |
dc.citation.startPage | 66 | - |
dc.citation.endPage | 71 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | GATE | - |
dc.subject.keywordPlus | FETS | - |
dc.subject.keywordAuthor | Tunnel FET | - |
dc.subject.keywordAuthor | Calibration | - |
dc.subject.keywordAuthor | TCAD simulation | - |
dc.subject.keywordAuthor | SPICE model | - |
dc.subject.keywordAuthor | Device modeling | - |
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