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A SPICE model of silicon tunneling field-effect transistors

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dc.contributor.authorWoo, Sola-
dc.contributor.authorKim, Minsuk-
dc.contributor.authorKim, Sangsig-
dc.date.accessioned2021-09-02T11:38:40Z-
dc.date.available2021-09-02T11:38:40Z-
dc.date.created2021-06-19-
dc.date.issued2018-05-05-
dc.identifier.issn0167-9317-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/75568-
dc.description.abstractIn this study, we propose a precise model of silicon tunneling field-effect transistors (TFETs) by modifying the Kane-Sze tunneling formula. In our model, a reference device is calibrated by utilizing TCAD and SPICE simulation. Electrical parameters extracted in our TCAD simulation are applied to a SPICE model not only for adopting the off-state current of a p-i-n diode under a reverse bias state but also for developing the threshold voltage and electric field equations. Furthermore, a basic complementary TFET inverter is simulated to demonstrate the capabilities of our proposed model. (C) 2018 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectGATE-
dc.subjectFETS-
dc.titleA SPICE model of silicon tunneling field-effect transistors-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Sangsig-
dc.identifier.doi10.1016/j.mee.2018.01.028-
dc.identifier.scopusid2-s2.0-85041456917-
dc.identifier.wosid000428104900012-
dc.identifier.bibliographicCitationMICROELECTRONIC ENGINEERING, v.191, pp.66 - 71-
dc.relation.isPartOfMICROELECTRONIC ENGINEERING-
dc.citation.titleMICROELECTRONIC ENGINEERING-
dc.citation.volume191-
dc.citation.startPage66-
dc.citation.endPage71-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusGATE-
dc.subject.keywordPlusFETS-
dc.subject.keywordAuthorTunnel FET-
dc.subject.keywordAuthorCalibration-
dc.subject.keywordAuthorTCAD simulation-
dc.subject.keywordAuthorSPICE model-
dc.subject.keywordAuthorDevice modeling-
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공과대학 (전기전자공학부)
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