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Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Authors
Han, Jun HeeLee, Kyu WonLee, Cheol EuiKim, Se-Hun
Issue Date
2월-2018
Publisher
KOREAN PHYSICAL SOC
Keywords
Nafion membrane; Dielectric relaxation; Impedance spectroscopy
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.72, no.3, pp.476 - 479
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
72
Number
3
Start Page
476
End Page
479
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/77462
DOI
10.3938/jkps.72.476
ISSN
0374-4884
Abstract
We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, T (g) = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around T (g) .
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