Transitional analysis of organic thin color filter layers in displays during baking process using multi-speckle diffusing wave spectroscopy

Abstract

The color filter (CF) is one of the key components for improving the performance of TV displays such as liquid crystal display (LCD) and white organic light emitting diodes (WOLED). The profile defects like undercut during the fine fabrication processes for CF layers are inevitably generated through the UV exposure and development processes, however, these can be controlled through the baking process. In order to resolve the profile defects of CF layers, in this study, the real-time dynamic changes of CF layers are monitored during the baking process by changing components such as polymeric binder and acrylate. The motion of pigment particles in CF layers during baking is quantitatively interpreted using multi-speckle diffusing wave spectroscopy (MSDWS), in terms of the autocorrelation function and the characteristic time of alpha-relaxation.