Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Cr/ITO semi-transparent n-type electrode for high-efficiency AlGaN/InGaN-based near ultraviolet light-emitting diodes

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Hwankyo-
dc.contributor.authorKim, Dae-Hyun-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2021-09-02T23:47:50Z-
dc.date.available2021-09-02T23:47:50Z-
dc.date.created2021-06-19-
dc.date.issued2017-11-
dc.identifier.issn0749-6036-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/81745-
dc.description.abstractWe investigated the electrical performance of near ultraviolet (NUV) (390 nm) light-emitting diodes (LEDs) fabricated with various semi-transparent Cr/ITO n-type contacts. It was shown that after annealing at 400 degrees C, Cr/ITO (10 nm/40 nm) contact was ohmic with a specific contact resistance of 9.8 x 10(-4) Omega cm(2). NUV AlGaN-based LEDs fabricated with different Cr/ITO (6-12 nm/40 nm) electrodes exhibited forward-bias voltages of 3.27-3.30 V at an injection current of 20 mA, which are similar to that of reference LED with Cr/Ni/Au (20 nm/25 nm/200 nm) electrode (3.29 V). The LEDs with the Cr/ITO electrodes gave series resistances of 10.69-11.98 Omega, while the series resistance is 10.84 Ohm for the reference LED. The transmittance of the Cr/ITO samples significantly improved when annealed at 400 degrees C. The transmittance (25.8-45.2% at 390 nm) of the annealed samples decreased with increasing Cr layer thickness. The LEDs with the Cr/ITO electrodes exhibited higher light output power than reference LED (with Cr/Ni/Au electrode). In particular, the LED with the Cr/ITO (12 nm/40 nm) electrode showed 9.3% higher light output power at 100 mA than reference LED. Based on the X-ray photoemission spectroscopy (XPS) and electrical results, the ohmic formation mechanism is described and discussed. (C) 2017 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD-
dc.subjectP-TYPE GAN-
dc.subjectOHMIC CONTACTS-
dc.subjectTIN OXIDE-
dc.subjectTITANIUM NITRIDE-
dc.subjectGALLIUM NITRIDE-
dc.subjectLOW-RESISTANCE-
dc.subjectTRANSPARENT-
dc.subjectTI/AL/NI/AU-
dc.subjectFILMS-
dc.titleCr/ITO semi-transparent n-type electrode for high-efficiency AlGaN/InGaN-based near ultraviolet light-emitting diodes-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1016/j.spmi.2017.07.044-
dc.identifier.scopusid2-s2.0-85026322312-
dc.identifier.wosid000415768800095-
dc.identifier.bibliographicCitationSUPERLATTICES AND MICROSTRUCTURES, v.111, pp.872 - 877-
dc.relation.isPartOfSUPERLATTICES AND MICROSTRUCTURES-
dc.citation.titleSUPERLATTICES AND MICROSTRUCTURES-
dc.citation.volume111-
dc.citation.startPage872-
dc.citation.endPage877-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusP-TYPE GAN-
dc.subject.keywordPlusOHMIC CONTACTS-
dc.subject.keywordPlusTIN OXIDE-
dc.subject.keywordPlusTITANIUM NITRIDE-
dc.subject.keywordPlusGALLIUM NITRIDE-
dc.subject.keywordPlusLOW-RESISTANCE-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusTI/AL/NI/AU-
dc.subject.keywordPlusFILMS-
dc.subject.keywordAuthorCr/ITO-
dc.subject.keywordAuthorElectrode-
dc.subject.keywordAuthorUltraviolet light-emitting diode-
dc.subject.keywordAuthorTransmittance-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher SEONG, TAE YEON photo

SEONG, TAE YEON
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE