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Adaptive ECC for Tailored Protection of Nanoscale Memory
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shin, Dongyeob | - |
| dc.contributor.author | Park, Jongsun | - |
| dc.contributor.author | Park, Jangwon | - |
| dc.contributor.author | Paul, Somnath | - |
| dc.contributor.author | Bhunia, Swarup | - |
| dc.date.accessioned | 2021-09-02T23:55:14Z | - |
| dc.date.available | 2021-09-02T23:55:14Z | - |
| dc.date.created | 2021-06-19 | - |
| dc.date.issued | 2017-11 | - |
| dc.identifier.issn | 2168-2356 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/81805 | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.subject | RELIABILITY | - |
| dc.subject | CIRCUITS | - |
| dc.title | Adaptive ECC for Tailored Protection of Nanoscale Memory | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Park, Jongsun | - |
| dc.identifier.doi | 10.1109/MDAT.2016.2615844 | - |
| dc.identifier.scopusid | 2-s2.0-85037732215 | - |
| dc.identifier.wosid | 000416261800010 | - |
| dc.identifier.bibliographicCitation | IEEE DESIGN & TEST, v.34, no.6, pp.84 - 93 | - |
| dc.relation.isPartOf | IEEE DESIGN & TEST | - |
| dc.citation.title | IEEE DESIGN & TEST | - |
| dc.citation.volume | 34 | - |
| dc.citation.number | 6 | - |
| dc.citation.startPage | 84 | - |
| dc.citation.endPage | 93 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Hardware & Architecture | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordPlus | RELIABILITY | - |
| dc.subject.keywordPlus | CIRCUITS | - |
| dc.subject.keywordAuthor | Error Correction Code (ECC) | - |
| dc.subject.keywordAuthor | Memory Failures | - |
| dc.subject.keywordAuthor | Robust Nanoscale Memory | - |
| dc.subject.keywordAuthor | Run-time Protection | - |
| dc.subject.keywordAuthor | Variable ECC | - |
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