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Measurement of the branching fraction and CP asymmetry in B-0 -> pi(0)pi(0) decays, and an improved constraint on phi(2)
- Authors
- Julius, T.; Sevior, M. E.; Mohanty, G. B.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bakich, A. M.; Bansal, V.; Barberio, E.; Barrett, M.; Berger, M.; Bhardwaj, V.; Bhuyan, B.; Biswal, J.; Bloomfield, T.; Bobrov, A.; Bondar, A.; Bonvicini, G.; Bozek, A.; Bracko, M.; Browder, T. E.; Cervenkov, D.; Chang, M-C; Chao, Y.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Choi, Y.; Cinabro, D.; Dash, N.; Di Carlo, S.; Dolezal, Z.; Dossett, D.; Drasal, Z.; Dutta, D.; Eidelman, S.; Farhat, H.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Gillard, R.; Goldenzweig, P.; Haba, J.; Hara, T.; Hayasaka, K.; Hayashii, H.; Hou, W-S; Hsu, C-L; Iijima, T.; Inami, K.; Ishikawa, A.; Itoh, R.; Iwasaki, Y.; Jacobs, W. W.; Jaegle, I.; Jin, Y.; Joffe, D.; Joo, K. K.; Kahn, J.; Karyan, G.; Katrenko, P.; Kawasaki, T.; Kiesling, C.; Kim, D. Y.; Kim, H. J.; Kim, J. B.; Kim, K. T.; Kim, M. J.; Kim, S. H.; Kim, Y. J.; Kinoshita, K.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Krokovny, P.; Krohn, J. F.; Kuhr, T.; Kulasiri, R.; Kuzmin, A.; Kwon, Y-J; Lange, J. S.; Lee, I. S.; Li, C. H.; Li, L.; Li, Y.; Li Gioi, L.; Libby, J.; Liventsev, D.; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Moon, H. K.; Mori, T.; Mussa, R.; Nakano, E.; Nakao, M.; Nanut, T.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Nisar, N. K.; Nishida, S.; Ogawa, S.; Ono, H.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, C-S; Park, H.; Pesantez, L.; Pestotnik, R.; Piilonen, L. E.; Pulvermacher, C.; Ritter, M.; Sahoo, H.; Sakai, Y.; Salehi, M.; Sandilya, S.; Santelj, L.; Sanuki, T.; Sato, Y.; Savinov, V.; Schneider, O.; Schnell, G.; Schwanda, C.; Schwartz, A. J.; Seino, Y.; Senyo, K.; Shebalin, V.; Shibata, T-A; Shiu, J-G.; Shwartz, B.; Sokolov, A.; Solovieva, E.; Staric, M.; Sumiyoshi, T.; Tamponi, U.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uehara, S.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Usov, Y.; Van Hulse, C.; Varner, G.; Varvell, K. E.; Vossen, A.; Waheed, E.; Wang, C. H.; Wang, M-Z; Wang, P.; Watanabe, M.; Watanabe, Y.; Widmann, E.; Williams, K. M.; Won, E.; Yamashita, Y.; Ye, H.; Yuan, C. Z.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhulanov, V.; Zupanc, A.
- Issue Date
- 31-8월-2017
- Publisher
- AMER PHYSICAL SOC
- Citation
- PHYSICAL REVIEW D, v.96, no.3
- Indexed
- SCIE
SCOPUS
- Journal Title
- PHYSICAL REVIEW D
- Volume
- 96
- Number
- 3
- ISSN
- 2470-0010
- Abstract
- We measure the branching fraction and CP violation asymmetry in the decay B-0 -> pi(0)pi(0), using a data sample of 752 x 10(6) B (B) over bar pairs collected at the Y(4S) resonance with the Belle detector at the KEKB e(+)e(-) collider. The obtained branching fraction and direct CP asymmetry are B(B -> pi(0)pi(0)) = [1.31 +/- 0.19(stat) +/- 0.19(syst)] x 10(-6) and A(CP) = +0.14 +/- 0.36(stat) +/- 0.10(syst), respectively. The signal significance, including the systematic uncertainty, is 6.4 standard deviations. We combine these results with Belle's earlier measurements of B-0 -> pi(+)pi(-) and B-+/- -> pi(+/-)pi(0) to exclude the CP-violating parameter phi(2) from the range 15.5 degrees < phi(2) < 75.0 degrees at 95% confidence level.
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