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Surface Pinning Effect of an Antiferromagnetic Interlayer Exchange Coupling in (Ga1-xMnxAs/GaAs: Be)(10) Multilayer

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dc.contributor.authorCho, Byeong-Gwan-
dc.contributor.authorKim, Dong-Ok-
dc.contributor.authorKim, Jae-Young-
dc.contributor.authorChung, Jae-Ho-
dc.contributor.authorLee, Sanghoon-
dc.contributor.authorChoi, Yongseong-
dc.contributor.authorChoi, Jun Woo-
dc.contributor.authorLee, Dong Ryeol-
dc.contributor.authorLee, Ki Bong-
dc.date.accessioned2021-09-03T04:34:34Z-
dc.date.available2021-09-03T04:34:34Z-
dc.date.created2021-06-16-
dc.date.issued2017-07-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/82998-
dc.description.abstractThe depth-resolved magnetic configuration of a Ga0.97Mn0.03As/GaAs:Be multilayer with an antiferromagnetic interlayer exchange coupling was investigated using surface-sensitive soft x-ray resonant magnetic reflectivity (XRMR). We observed intriguing opposite increments in the XRMR intensities at the half-Bragg peak position between two different remanent states with opposite field sweep directions. A quantitative analysis shows that these opposite intensity increments result from two different anti-parallel spin configurations in such a way that the magnetization of top-most magnetic layer is pinned along the saturation magnetization direction before the remanent state. This surface pinning effect is important for understanding spin-dependent transport in semiconducting magnetic multilayers.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherKOREAN PHYSICAL SOC-
dc.subjectX-RAY-
dc.subjectFERROMAGNETIC SEMICONDUCTORS-
dc.subjectREFLECTION-
dc.subjectSCATTERING-
dc.subjectGMR-
dc.titleSurface Pinning Effect of an Antiferromagnetic Interlayer Exchange Coupling in (Ga1-xMnxAs/GaAs: Be)(10) Multilayer-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Jae-Ho-
dc.contributor.affiliatedAuthorLee, Sanghoon-
dc.identifier.doi10.3938/jkps.71.121-
dc.identifier.scopusid2-s2.0-85025171261-
dc.identifier.wosid000406119500010-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.71, no.2, pp.121 - 125-
dc.relation.isPartOfJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume71-
dc.citation.number2-
dc.citation.startPage121-
dc.citation.endPage125-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART002245988-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.subject.keywordPlusX-RAY-
dc.subject.keywordPlusFERROMAGNETIC SEMICONDUCTORS-
dc.subject.keywordPlusREFLECTION-
dc.subject.keywordPlusSCATTERING-
dc.subject.keywordPlusGMR-
dc.subject.keywordAuthorDilute magnetic semiconductors-
dc.subject.keywordAuthorMagnetic multilayer-
dc.subject.keywordAuthorInterlayer exchange coupling-
dc.subject.keywordAuthorX-ray resonant magnetic reflectivity-
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