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Essential Macleod Program (EMP) simulated fabrication of high quality Zn:SnO2/Ag/Zn:SnO2 multilayer transparent conducting electrode on flexible substrates

Authors
Cho, YoonhoParmar, Narendra S.Nahm, SahnChoi, Ji-Won
Issue Date
15-6월-2017
Publisher
ELSEVIER SCI LTD
Keywords
TCO; OMO multilayer; SnO2; Zn-doping; Optical and electrical properties
Citation
CERAMICS INTERNATIONAL, v.43, no.9, pp.7216 - 7221
Indexed
SCIE
SCOPUS
Journal Title
CERAMICS INTERNATIONAL
Volume
43
Number
9
Start Page
7216
End Page
7221
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/83128
DOI
10.1016/j.ceramint.2017.03.010
ISSN
0272-8842
Abstract
In the quest of promising Indium free amorphous transparent conducting oxide (TCO), Zn-doped SnO2/Ag/Zn-doped SnO2 (OMO) multilayer films were prepared on flexible polyethylene terephthalate (PET) substrates by RF sputtering at room temperature (RT). Growth parameters were optimized by varying sputtering power and working pressure, to have high electrical conductivity and optical transmittance. Optimization of the thickness of each layer was done by Essential Macleod Program (EMP) simulation to get the higher transmission through OMO multilayer. The sheet resistance and transmittance of 3 at% Zn-doped SnO2 thin film (30 nm) were 2.23 k Omega/square, (rho similar to 8.92x10(-3) Omega.cm) and 81.3% (at lambda similar to 550 nm), respectively. By using optimized thicknesses of Zn-doped SnO2 (30 nm) and Ag (12 nm) and optimized growth condition Zn-doped SnO2/Ag/Zn-doped SnO2 multilayer thin films were deposited. The low sheet resistance of 7.2, Omega/square and high optical transmittance of 85.1% in the 550 nm wavelength region was achieved with 72 nm multilayer film.
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