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High-dimensional feature extraction using bit-plane decomposition of local binary patterns for robust face recognition

Authors
Yoo, Cheol-HwanKim, Seung-WookJung, June -YoungKo, Sung-Jea
Issue Date
5월-2017
Publisher
ACADEMIC PRESS INC ELSEVIER SCIENCE
Keywords
Face recognition; Feature extraction; Local binary pattern; High-dimensional feature; Linear discriminant analysis; Bit-plane decomposition
Citation
JOURNAL OF VISUAL COMMUNICATION AND IMAGE REPRESENTATION, v.45, pp.11 - 19
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF VISUAL COMMUNICATION AND IMAGE REPRESENTATION
Volume
45
Start Page
11
End Page
19
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/83646
DOI
10.1016/j.jvcir.2017.02.009
ISSN
1047-3203
Abstract
Transforming an original image into a high-dimensional (HD) feature has been proven to be effective in classifying images. This paper presents a novel feature extraction method utilizing the HD feature space to improve the discriminative ability for face recognition. We observed that the local binary pattern can be decomposed into bit-planes, each of which has scale-specific directional information of the face image. Each bit-plane not only has the inherent local-structure of the face image but also has an illumination robust characteristic. By concatenating all the decomposed bit-planes, we generate an HD feature vector with an improved discriminative ability. To reduce the computational complexity while preserving the incorporated local structural information, a supervised dimension reduction method, the orthogonal linear discriminant analysis, is applied to the HD feature vector. Extensive experimental results show that existing classifiers with the proposed feature outperform those with other conventional features under various illumination, pose, and expression variations. (C) 2017 Elsevier Inc. All rights reserved.
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