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Steep switching characteristics of single-gated feedback field-effect transistors

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dc.contributor.authorKim, Minsuk-
dc.contributor.authorKim, Yoonjoong-
dc.contributor.authorLim, Doohyeok-
dc.contributor.authorWoo, Sola-
dc.contributor.authorCho, Kyoungah-
dc.contributor.authorKim, Sangsig-
dc.date.accessioned2021-09-03T09:38:40Z-
dc.date.available2021-09-03T09:38:40Z-
dc.date.created2021-06-16-
dc.date.issued2017-02-03-
dc.identifier.issn0957-4484-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/84471-
dc.description.abstractIn this study, we propose newly designed feedback field-effect transistors that utilize the. positive feedback of charge carriers in single-gated silicon channels to achieve steep switching behaviors. The band diagram, I-V characteristics, subthreshold swing, and on/off current ratio are analyzed using a commercial device simulator. Our proposed feedback field-effect transistors exhibit subthreshold swings of less than 0.1 mV dec(-1), an on/off current ratio of approximately 10(11), and an on-current of approximately 10(-4) A at room temperature, demonstrating that the switching characteristics are superior to those. of other silicon-based devices. In addition, the device parameters that affect the device performance, hysteresis characteristics, and temperature-dependent device characteristics are discussed in detail.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.subjectNEGATIVE CAPACITANCE-
dc.subjectIMPACT-IONIZATION-
dc.subjectENERGY-EFFICIENT-
dc.subjectOPERATION-
dc.subjectDEVICES-
dc.subjectFET-
dc.titleSteep switching characteristics of single-gated feedback field-effect transistors-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Sangsig-
dc.identifier.doi10.1088/1361-6528/28/5/055205-
dc.identifier.scopusid2-s2.0-85009060717-
dc.identifier.wosid000412980800001-
dc.identifier.bibliographicCitationNANOTECHNOLOGY, v.28, no.5-
dc.relation.isPartOfNANOTECHNOLOGY-
dc.citation.titleNANOTECHNOLOGY-
dc.citation.volume28-
dc.citation.number5-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusNEGATIVE CAPACITANCE-
dc.subject.keywordPlusIMPACT-IONIZATION-
dc.subject.keywordPlusENERGY-EFFICIENT-
dc.subject.keywordPlusOPERATION-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusFET-
dc.subject.keywordAuthorfeedback field-effect transistors-
dc.subject.keywordAuthorsteep switching characteristics-
dc.subject.keywordAuthorsubthreshold swing-
dc.subject.keywordAuthorpositive feedback loop-
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