Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Solar-Blind Metal-Semiconductor-Metal Photodetectors Based on an Exfoliated beta-Ga2O3 Micro-Flake

Full metadata record
DC Field Value Language
dc.contributor.authorOh, Sooyeoun-
dc.contributor.authorMastro, Michael A.-
dc.contributor.authorTadjer, Marko J.-
dc.contributor.authorKim, Jihyun-
dc.date.accessioned2021-09-03T15:01:26Z-
dc.date.available2021-09-03T15:01:26Z-
dc.date.created2021-06-16-
dc.date.issued2017-
dc.identifier.issn2162-8769-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/86319-
dc.description.abstractSemiconductor materials ideal for solar-blind photodetectors (PDs) require an ultra-wide and direct bandgap to detect UV-C spectral wavelengths effectively. Using the mechanically exfoliated high-quality beta-Ga2O3 micro-flakes that have a direct bandgap of similar to 4.8 eV, we fabricated solar-blind PDs with a metal-semiconductor-metal (MSM) structure that can reduce the dark current, and then systemically investigated their photoresponse properties. The MSM devices with two Ni/Au Schottky contacts exhibited an extremely low dark current and high sensitivity (ratio of photocurrent to dark current > 10(3)) in UV-C wavelengths. In addition, they exhibited fast and stable on/off characteristics and high responsivity (1.68 A/W), with a superior rejection ratio when compared with the reported thin-film MSM solar-blind PDs, indicating the high potential of the quasi-two-dimensional beta-Ga2O3 for optoelectronic applications. (C) 2017 The Electrochemical Society. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELECTROCHEMICAL SOC INC-
dc.subjectGALLIUM OXIDE-FILMS-
dc.subjectDEFECTS-
dc.titleSolar-Blind Metal-Semiconductor-Metal Photodetectors Based on an Exfoliated beta-Ga2O3 Micro-Flake-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jihyun-
dc.identifier.doi10.1149/2.0231708jss-
dc.identifier.scopusid2-s2.0-85033717914-
dc.identifier.wosid000409883900023-
dc.identifier.bibliographicCitationECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.6, no.8, pp.Q79 - Q83-
dc.relation.isPartOfECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY-
dc.citation.titleECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY-
dc.citation.volume6-
dc.citation.number8-
dc.citation.startPageQ79-
dc.citation.endPageQ83-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusGALLIUM OXIDE-FILMS-
dc.subject.keywordPlusDEFECTS-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Chemical and Biological Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE