Solar-Blind Metal-Semiconductor-Metal Photodetectors Based on an Exfoliated beta-Ga2O3 Micro-Flake
- Authors
- Oh, Sooyeoun; Mastro, Michael A.; Tadjer, Marko J.; Kim, Jihyun
- Issue Date
- 2017
- Publisher
- ELECTROCHEMICAL SOC INC
- Citation
- ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.6, no.8, pp.Q79 - Q83
- Indexed
- SCIE
SCOPUS
- Journal Title
- ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
- Volume
- 6
- Number
- 8
- Start Page
- Q79
- End Page
- Q83
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/86319
- DOI
- 10.1149/2.0231708jss
- ISSN
- 2162-8769
- Abstract
- Semiconductor materials ideal for solar-blind photodetectors (PDs) require an ultra-wide and direct bandgap to detect UV-C spectral wavelengths effectively. Using the mechanically exfoliated high-quality beta-Ga2O3 micro-flakes that have a direct bandgap of similar to 4.8 eV, we fabricated solar-blind PDs with a metal-semiconductor-metal (MSM) structure that can reduce the dark current, and then systemically investigated their photoresponse properties. The MSM devices with two Ni/Au Schottky contacts exhibited an extremely low dark current and high sensitivity (ratio of photocurrent to dark current > 10(3)) in UV-C wavelengths. In addition, they exhibited fast and stable on/off characteristics and high responsivity (1.68 A/W), with a superior rejection ratio when compared with the reported thin-film MSM solar-blind PDs, indicating the high potential of the quasi-two-dimensional beta-Ga2O3 for optoelectronic applications. (C) 2017 The Electrochemical Society. All rights reserved.
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