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Transparent bipolar resistive switching memory on a flexible substrate with indium-zinc-oxide electrodes

Authors
Yeom, Seung-WonHa, Hyeon JunPark, JunsuShim, Jae WonJu, Byeong-Kwon
Issue Date
Dec-2016
Publisher
KOREAN PHYSICAL SOC
Keywords
Oxygen vacancy; ReRAM; Resistive switching; TiO2; Poole-Frenkel emission; Flexible electronics; Transparent electronics
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.69, no.11, pp.1613 - 1618
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
69
Number
11
Start Page
1613
End Page
1618
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/86722
DOI
10.3938/jkps.69.1613
ISSN
0374-4884
Abstract
We fabricated transparent indium zinc oxide (IZO)/TiO2/IZO devices on flexible polyethylene phthalate (PET) substrates. These devices demonstrate bipolar resistive switching behavior, exhibit a transmittance greater than 80 % for visible light, and have stable resistive switching properties, including long retention and good endurance. In addition, the devices were investigated based on their temperature dependence; the results show metallic properties in the low-resistance state (LRS) and semiconducting properties in the high-resistance state (HRS). The conduction mechanism for resistive switching in our device was well-fitted with Ohmic conduction in the LRS and Poole-Frenkel emission in the HRS. The mechanism could be explained by the formation and the rupture of the conduction paths formed by the movement of oxygen ions and vacancies. Moreover, acute bending of the devices did not affect the memory characteristics because of the pliability of both the IZO electrodes and the thin oxide layer. These results indicate potential applications as resistive random access memories in future flexible, transparent electronic devices.
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