Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Polymer-Metal Composite Thin Film Microcap Packaging Technology Using Low Temperature SU-8 Bonding

Authors
Choi, JinnilKim, Yong-KookKim, Soo-WonNam, Byung HyunJu, Byeong-Kwon
Issue Date
11월-2016
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Microcap Packaging; Micro/Nano-Electromechanical Systems (MEMS/NEMS); Bonding; Finite Element Analysis
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.11, pp.11613 - 11618
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
16
Number
11
Start Page
11613
End Page
11618
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/86909
DOI
10.1166/jnn.2016.13561
ISSN
1533-4880
Abstract
This paper reports a packaging technology involving a lightweight, low temperature bonding process with a polymer-metal composite thin film microcap. A layer of SU-8, in the form of sealing rims, is used as an adhesive to bond the micro and nano-electromechanical systems (MEMS/NEMS) substrate with the microcap due to the excellent properties of SU-8 as a packaging material. A silicon oxide thin film layer is formed on the carrier wafer by using a furnace to separate the microcap from the carrier wafer once the bonding process between the host and the carrier wafer is complete. In addition, the thin-film polymer microcap retains its original shape and acts as a protective layer for the cavity after the carrier wafer is released. To characterize the bonding strength, tensile tests have been carried out, and the measurement results show that the bond strength is up to similar to 15 MPa. This means that the proposed packaging method, with the thin-film polymer microcap on the host wafer, was successfully realized by the low temperature bonding and transfer process. Finally, to check and verify the mechanical conditions, such as stress and deflection, of the microcap in the atmosphere, finite element (FE) analysis has been performed.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ju, Byeong kwon photo

Ju, Byeong kwon
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE