Thermal conductivity of silicon nanowires embedded on thermoelectric platforms
DC Field | Value | Language |
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dc.contributor.author | Choi, JinYong | - |
dc.contributor.author | Cho, Kyoungah | - |
dc.contributor.author | Yoon, Dae Sung | - |
dc.contributor.author | Kim, Sangsig | - |
dc.date.accessioned | 2021-09-03T19:46:28Z | - |
dc.date.available | 2021-09-03T19:46:28Z | - |
dc.date.created | 2021-06-16 | - |
dc.date.issued | 2016-10 | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/87447 | - |
dc.description.abstract | In this study, we propose a simple method for obtaining the thermal conductivity of silicon nanowires (SiNWs) embedded on a thermoelectric platform. The approximation of the heat flux in SiNWs with temperature differences enables the determination of thermal conductivity. Using this method, the thermal conductivities of our n- and p-type SiNWs are found to be 18.06 +/- 0.12 and 20.29 +/- 0.77 W m(-1).K-1, respectively. The atomic weight of arsenic ions in the n-type SiNWs is responsible for a lower thermal conductivity than that of boron ions in the p-type SiNWs. Our results demonstrate that this simple method is capable of measuring the thermal conductivity of thermoelectric nanomaterials embedded on thermoelectric devices. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | SCATTERING | - |
dc.subject | LAYERS | - |
dc.subject | FILMS | - |
dc.title | Thermal conductivity of silicon nanowires embedded on thermoelectric platforms | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Cho, Kyoungah | - |
dc.contributor.affiliatedAuthor | Yoon, Dae Sung | - |
dc.contributor.affiliatedAuthor | Kim, Sangsig | - |
dc.identifier.doi | 10.1088/0957-0233/27/10/105007 | - |
dc.identifier.scopusid | 2-s2.0-84989862613 | - |
dc.identifier.wosid | 000384134900002 | - |
dc.identifier.bibliographicCitation | MEASUREMENT SCIENCE AND TECHNOLOGY, v.27, no.10 | - |
dc.relation.isPartOf | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.citation.title | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 27 | - |
dc.citation.number | 10 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Engineering, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.subject.keywordPlus | SCATTERING | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordAuthor | Si nanowires | - |
dc.subject.keywordAuthor | thermal conductivity | - |
dc.subject.keywordAuthor | plastic | - |
dc.subject.keywordAuthor | heat transfer | - |
dc.subject.keywordAuthor | thermoelectric module | - |
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