Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer
- Authors
- Lee, Jehyun; Park, Sooyoung; Seo, Dae Han; Yim, Sin Hyuk; Yoon, Seokchan; Cho, D.
- Issue Date
- 19-9월-2016
- Publisher
- OPTICAL SOC AMER
- Citation
- OPTICS EXPRESS, v.24, no.19, pp.21910 - 21920
- Indexed
- SCIE
SCOPUS
- Journal Title
- OPTICS EXPRESS
- Volume
- 24
- Number
- 19
- Start Page
- 21910
- End Page
- 21920
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/87500
- DOI
- 10.1364/OE.24.021910
- ISSN
- 1094-4087
- Abstract
- We report on measurement of small displacements with sub-nanometer precision using an optoelectronic oscillator (OEO) with an intra-loop Michelson interferometer. In comparison with conventional homodyne and heterodyne detection methods, where displacement appears as a power change or a phase shift, respectively, in the OEO detection, the displacement produces a shift in the oscillation frequency. In comparison with typical OEO sensors, where the frequency shift is proportional to the OEO oscillation frequency in radio-frequency domain, the frequency shift in our method with an intra-loop interferometer is proportional to an optical frequency. We constructed a hybrid apparatus and compared characteristics of the OEO and heterodyne detection methods. (C) 2016 Optical Society of America
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Collections - College of Science > Department of Physics > 1. Journal Articles
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