Analysis of aluminum back surface field at different wafer specifications in crystalline silicon solar cells
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Sungeun | - |
dc.contributor.author | Park, Hyomin | - |
dc.contributor.author | Kang, Yoonmook | - |
dc.contributor.author | Lee, Hae-Seok | - |
dc.contributor.author | Kim, Donghwan | - |
dc.date.accessioned | 2021-09-03T20:49:46Z | - |
dc.date.available | 2021-09-03T20:49:46Z | - |
dc.date.created | 2021-06-16 | - |
dc.date.issued | 2016-09 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/87730 | - |
dc.description.abstract | The purpose of this work is to investigate a back surface field (BSF) at a number of wafer resistivities for industrial crystalline silicon solar cells. As indicated in this manuscript, doping a crucible-grown Czochralski (Cz)-Si ingot with Ga offers a sure way of eliminating light-induced degradation (LID) because LID is composed of B and O complex. However, the low segregation coefficient of Ga in Si causes a much wider resistivity variation in the Ga-doped Cz-Si ingot. This resistivity variation in a Cz-Si wafer at different locations varies the performance, as is already known. In the light of a B-doped wafer, we made wider resistivity in Si ingot; we investigated how resistivities affect the solar cell performance as a function of BSF quality. (C) 2016 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.subject | CONTACTS | - |
dc.subject | BSF | - |
dc.subject | RTP | - |
dc.title | Analysis of aluminum back surface field at different wafer specifications in crystalline silicon solar cells | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kang, Yoonmook | - |
dc.contributor.affiliatedAuthor | Lee, Hae-Seok | - |
dc.contributor.affiliatedAuthor | Kim, Donghwan | - |
dc.identifier.doi | 10.1016/j.cap.2016.05.016 | - |
dc.identifier.scopusid | 2-s2.0-84975744333 | - |
dc.identifier.wosid | 000384131600023 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.16, no.9, pp.1062 - 1068 | - |
dc.relation.isPartOf | CURRENT APPLIED PHYSICS | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 16 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 1062 | - |
dc.citation.endPage | 1068 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART002144874 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | CONTACTS | - |
dc.subject.keywordPlus | BSF | - |
dc.subject.keywordPlus | RTP | - |
dc.subject.keywordAuthor | Metallization | - |
dc.subject.keywordAuthor | Screen printing | - |
dc.subject.keywordAuthor | Wafer resistivity | - |
dc.subject.keywordAuthor | Al back contact | - |
dc.subject.keywordAuthor | Solar cells | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.