Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios

Authors
Hart, Jeffrey D.Choi, TaeryonYi, Seongbaek
Issue Date
Apr-2016
Publisher
ELSEVIER SCIENCE BV
Keywords
Bandwidth parameter; Empirical null distribution; Goodness-of-fit tests; Kernel density estimation; Marginal likelihoods
Citation
COMPUTATIONAL STATISTICS & DATA ANALYSIS, v.96, pp.120 - 132
Indexed
SCIE
SCOPUS
Journal Title
COMPUTATIONAL STATISTICS & DATA ANALYSIS
Volume
96
Start Page
120
End Page
132
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/89083
DOI
10.1016/j.csda.2015.10.013
ISSN
0167-9473
Abstract
A nonparametric procedure for testing the goodness of fit of a parametric density is investigated. The test statistic is the ratio of two marginal likelihoods corresponding to a kernel estimate and the parametric model. The marginal likelihood for the kernel estimate is obtained by proposing a prior for the estimate's bandwidth, and then integrating the product of this prior and a leave-one-out kernel likelihood. Properties of the kernel-based marginal likelihood depend importantly on the kernel used. In particular, a specific, somewhat heavy-tailed, kernel K-0 yields better performing marginal likelihood ratios than does the popular Gaussian kernel. Monte Carlo is used to compare the power of the new test with that of the Shapiro-Wilk test, the Kolmogorov Smirnov test, and a recently proposed goodness-of-fit test based on empirical likelihood ratios. Properties of these tests are considered when testing the fit of normal and double exponential distributions. The new test is used to establish a claim made in the astronomy literature concerning the distribution of nebulae brightnesses in the Andromeda galaxy. Generalizations to the multivariate case are also described. (C) 2015 Elsevier B.V. All rights reserved.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Political Science & Economics > Department of Statistics > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Choi, Tae ryon photo

Choi, Tae ryon
College of Political Science & Economics (Department of Statistics)
Read more

Altmetrics

Total Views & Downloads

BROWSE