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Study on elimination of screening-current-induced field in pancake-type non-insulated HTS coil

Authors
Kim, K. L.Song, J. B.Yang, D. G.Kim, Y. G.Kim, T. H.Kim, S. K.Park, M. W.Lee, H. G.
Issue Date
Mar-2016
Publisher
IOP PUBLISHING LTD
Keywords
no-insulation; pancake coil; high temperature superconductor; screening current induced field
Citation
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.29, no.3
Indexed
SCIE
SCOPUS
Journal Title
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
Volume
29
Number
3
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/89400
DOI
10.1088/0953-2048/29/3/035009
ISSN
0953-2048
Abstract
This paper presents the details of a recent study on the removal of the screening-current-induced field (SCIF) in a pancake-type non-insulated high-temperature superconductor coil (NI coil). To determine the SCIF in the NI coil, the magnetic flux density (B-z) was calculated using the equivalent circuit model of the coil and compared to the B-z obtained empirically. The experimental results indicate that the SCIF elimination in the NI coil was enhanced upon increasing the amplitude and frequency of the AC current being supplied to the background coil. Moreover, the SCIF in the NI coil was successfully removed by applying the appropriate external AC magnetic field intensity. This is because the magnetization direction of the SCIF changed completely from radial to spiral, a phenomenon termed the 'vortex shaking effect.' Overall, this study confirmed that the SCIF in a pancake-type NI coil can be effectively removed by exposing the coil to an external AC magnetic field.
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