Dependence of Q Factor on Surface Roughness in a Plasmonic Cavity
- Authors
- Kim, Yoon-Ho; Kwon, Soon-Hong; Ee, Ho-Seok; Hwang, Yongsop; No, You-Shin; Park, Hong-Gyu
- Issue Date
- 2월-2016
- Publisher
- OPTICAL SOC KOREA
- Keywords
- Surface plasmon polaritons; Plasmonic cavities; Surface roughness; Finite-difference time-domain simulations
- Citation
- JOURNAL OF THE OPTICAL SOCIETY OF KOREA, v.20, no.1, pp.188 - 191
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF THE OPTICAL SOCIETY OF KOREA
- Volume
- 20
- Number
- 1
- Start Page
- 188
- End Page
- 191
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/89640
- DOI
- 10.3807/JOSK.2016.20.1.188
- ISSN
- 1226-4776
- Abstract
- We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.
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Collections - College of Science > Department of Physics > 1. Journal Articles
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