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Dependence of Q Factor on Surface Roughness in a Plasmonic Cavity

Authors
Kim, Yoon-HoKwon, Soon-HongEe, Ho-SeokHwang, YongsopNo, You-ShinPark, Hong-Gyu
Issue Date
Feb-2016
Publisher
OPTICAL SOC KOREA
Keywords
Surface plasmon polaritons; Plasmonic cavities; Surface roughness; Finite-difference time-domain simulations
Citation
JOURNAL OF THE OPTICAL SOCIETY OF KOREA, v.20, no.1, pp.188 - 191
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE OPTICAL SOCIETY OF KOREA
Volume
20
Number
1
Start Page
188
End Page
191
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/89640
DOI
10.3807/JOSK.2016.20.1.188
ISSN
1226-4776
Abstract
We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.
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