Carbon Coating and Defects in CdZnTe and CdMnTe Nuclear Detectors
DC Field | Value | Language |
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dc.contributor.author | Egarievwe, Stephen U. | - |
dc.contributor.author | Chan, Wing | - |
dc.contributor.author | Kim, Ki Hyun | - |
dc.contributor.author | Roy, Utpal N. | - |
dc.contributor.author | Sams, Valissa | - |
dc.contributor.author | Hossain, Anwar | - |
dc.contributor.author | Kassu, Aschalew | - |
dc.contributor.author | James, Ralph B. | - |
dc.date.accessioned | 2021-09-04T03:37:42Z | - |
dc.date.available | 2021-09-04T03:37:42Z | - |
dc.date.created | 2021-06-16 | - |
dc.date.issued | 2016-02 | - |
dc.identifier.issn | 0018-9499 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/89732 | - |
dc.description.abstract | CADMIUM zinc telluride (CdZnTe) and cadmium manganese telluride (CdMnTe) are prime materials for detecting X-rays and gamma-rays at room temperature due to their high average atomic numbers that are essential to having high stopping -power for incident high-energy electromagnetic radiations. A major obstacle in developing CdZnTe and CdMnTe detectors lies in growing crystals free from defects, such as Te inclusions, dislocations, sub-grain boundary networks, and precipitates. We present the results of our study of the relationship between carbon coating of the growth ampoule and dislocations in CdZnTe and sub-grain boundary networks in CdMnTe, grown by Bridgman method. For the CdZnTe crystals, a carbon-coating of 2 Am on the ampoule generated fewer dislocations than did a thinner 0.2 - mu m carbon-coated one. Furthermore, the ampoule's design (normal- or tapered-shape) did not affect the densities of etch pits as much as did the thickness of the carbon-coating. For a CdMnTe ingot with a carbon coating of about 2 mu m, created by cracking spectroscopic-grade acetone at rsd 900 degrees C, we observed very few grain boundaries and grain-boundary networks. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | CRYSTAL-GROWTH | - |
dc.subject | ETCH-PIT | - |
dc.subject | DOPED CDMNTE | - |
dc.subject | X-RAY | - |
dc.subject | CDTE | - |
dc.subject | PROGRESS | - |
dc.title | Carbon Coating and Defects in CdZnTe and CdMnTe Nuclear Detectors | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Ki Hyun | - |
dc.identifier.doi | 10.1109/TNS.2016.2515108 | - |
dc.identifier.scopusid | 2-s2.0-84962632814 | - |
dc.identifier.wosid | 000372012000006 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.1, pp.236 - 245 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | - |
dc.citation.title | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | - |
dc.citation.volume | 63 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 236 | - |
dc.citation.endPage | 245 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.subject.keywordPlus | CRYSTAL-GROWTH | - |
dc.subject.keywordPlus | ETCH-PIT | - |
dc.subject.keywordPlus | DOPED CDMNTE | - |
dc.subject.keywordPlus | X-RAY | - |
dc.subject.keywordPlus | CDTE | - |
dc.subject.keywordPlus | PROGRESS | - |
dc.subject.keywordAuthor | Bridgman crystal growth | - |
dc.subject.keywordAuthor | CdMnTe | - |
dc.subject.keywordAuthor | CdZnTe | - |
dc.subject.keywordAuthor | dislocations | - |
dc.subject.keywordAuthor | etch-pit densities | - |
dc.subject.keywordAuthor | gamma-ray detectors | - |
dc.subject.keywordAuthor | growth ampoules | - |
dc.subject.keywordAuthor | sub-grain boundary network | - |
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