Carbon Coating and Defects in CdZnTe and CdMnTe Nuclear Detectors
- Authors
- Egarievwe, Stephen U.; Chan, Wing; Kim, Ki Hyun; Roy, Utpal N.; Sams, Valissa; Hossain, Anwar; Kassu, Aschalew; James, Ralph B.
- Issue Date
- 2월-2016
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Bridgman crystal growth; CdMnTe; CdZnTe; dislocations; etch-pit densities; gamma-ray detectors; growth ampoules; sub-grain boundary network
- Citation
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.1, pp.236 - 245
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE
- Volume
- 63
- Number
- 1
- Start Page
- 236
- End Page
- 245
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/89732
- DOI
- 10.1109/TNS.2016.2515108
- ISSN
- 0018-9499
- Abstract
- CADMIUM zinc telluride (CdZnTe) and cadmium manganese telluride (CdMnTe) are prime materials for detecting X-rays and gamma-rays at room temperature due to their high average atomic numbers that are essential to having high stopping -power for incident high-energy electromagnetic radiations. A major obstacle in developing CdZnTe and CdMnTe detectors lies in growing crystals free from defects, such as Te inclusions, dislocations, sub-grain boundary networks, and precipitates. We present the results of our study of the relationship between carbon coating of the growth ampoule and dislocations in CdZnTe and sub-grain boundary networks in CdMnTe, grown by Bridgman method. For the CdZnTe crystals, a carbon-coating of 2 Am on the ampoule generated fewer dislocations than did a thinner 0.2 - mu m carbon-coated one. Furthermore, the ampoule's design (normal- or tapered-shape) did not affect the densities of etch pits as much as did the thickness of the carbon-coating. For a CdMnTe ingot with a carbon coating of about 2 mu m, created by cracking spectroscopic-grade acetone at rsd 900 degrees C, we observed very few grain boundaries and grain-boundary networks.
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