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One-Class Classification Methods for Process Monitoring and Diagnosis
- Authors
- Cho, Sugon; Kim, Seoung Bum
- Issue Date
- 11월-2015
- Publisher
- IEEE COMPUTER SOC
- Citation
- IEEE INTELLIGENT SYSTEMS, v.30, no.6, pp.16 - 18
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE INTELLIGENT SYSTEMS
- Volume
- 30
- Number
- 6
- Start Page
- 16
- End Page
- 18
- ISSN
- 1541-1672
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