Highly Transparent and Low-Resistance Indium-Free ZnO/Ag/ZnO Multilayer Electrodes for Organic Photovoltaic Devices
DC Field | Value | Language |
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dc.contributor.author | Kim, Jun Ho | - |
dc.contributor.author | Na, Jin-Young | - |
dc.contributor.author | Kim, Sun-Kyung | - |
dc.contributor.author | Yoo, Young-Zo | - |
dc.contributor.author | Seong, Tae-Yeon | - |
dc.date.accessioned | 2021-09-04T11:57:19Z | - |
dc.date.available | 2021-09-04T11:57:19Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2015-10 | - |
dc.identifier.issn | 0361-5235 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/92298 | - |
dc.description.abstract | We investigated the effect of ZnO layer thickness on the optical and electrical properties of ZnO/Ag/ZnO multilayer films deposited on glass substrates. The transmission window became wider and shifted toward the lower energy side with increasing ZnO thickness. The ZnO/Ag/ZnO (40 nm/18.8 nm/40 nm) multilayer sample showed transmittance of similar to 96% at 550nm. As the ZnO thickness was increased from 8 nm to 80 nm, the carrier concentration gradually decreased from 1.74 x 10(22) cm(-3) to 4.33 x 10(21) cm(-3), while the charge mobility varied from 23.8 cm(2)/V-s to 24.8 cm(2)/V-s. With increasing ZnO thickness, the samples exhibited similar sheet resistances of 3.6 Omega/sq to 3.9 Omega/sq, but the resistivity increased by a factor of 4.58. The samples showed smooth surfaces with root-mean-square roughness in the range of 0.47 nm to 0.94 nm. Haacke's figure of merit (FOM) was calculated for all the samples; the ZnO (40 nm)/Ag (18.8 nm)/ZnO (40 nm) multilayer produced the highest FOM of 148.9 x 10(-3) Omega(-1). | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER | - |
dc.subject | OPTICAL-PROPERTIES | - |
dc.subject | THIN-FILMS | - |
dc.subject | STRUCTURAL-PROPERTIES | - |
dc.subject | COMPOSITE ELECTRODE | - |
dc.subject | ZNO | - |
dc.subject | OPTIMIZATION | - |
dc.subject | LAYER | - |
dc.subject | CONDUCTOR | - |
dc.subject | SUBSTRATE | - |
dc.subject | DESIGN | - |
dc.title | Highly Transparent and Low-Resistance Indium-Free ZnO/Ag/ZnO Multilayer Electrodes for Organic Photovoltaic Devices | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Seong, Tae-Yeon | - |
dc.identifier.doi | 10.1007/s11664-015-3811-8 | - |
dc.identifier.scopusid | 2-s2.0-84940792898 | - |
dc.identifier.wosid | 000360672900102 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTRONIC MATERIALS, v.44, no.10, pp.3967 - 3972 | - |
dc.relation.isPartOf | JOURNAL OF ELECTRONIC MATERIALS | - |
dc.citation.title | JOURNAL OF ELECTRONIC MATERIALS | - |
dc.citation.volume | 44 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 3967 | - |
dc.citation.endPage | 3972 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | OPTICAL-PROPERTIES | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | STRUCTURAL-PROPERTIES | - |
dc.subject.keywordPlus | COMPOSITE ELECTRODE | - |
dc.subject.keywordPlus | ZNO | - |
dc.subject.keywordPlus | OPTIMIZATION | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordPlus | CONDUCTOR | - |
dc.subject.keywordPlus | SUBSTRATE | - |
dc.subject.keywordPlus | DESIGN | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | Ag | - |
dc.subject.keywordAuthor | multilayer | - |
dc.subject.keywordAuthor | transparent conducting electrode | - |
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