Analysis of Defects on Chemically-Treated CdZnTe Surfaces
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hossain, A. | - |
dc.contributor.author | Bolotnikov, A. E. | - |
dc.contributor.author | Camarda, G. S. | - |
dc.contributor.author | Cui, Y. | - |
dc.contributor.author | Gul, R. | - |
dc.contributor.author | Kim, K. -H. | - |
dc.contributor.author | Roy, U. N. | - |
dc.contributor.author | Tong, X. | - |
dc.contributor.author | Yang, G. | - |
dc.contributor.author | James, R. B. | - |
dc.date.accessioned | 2021-09-04T12:54:09Z | - |
dc.date.available | 2021-09-04T12:54:09Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2015-09 | - |
dc.identifier.issn | 0361-5235 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/92530 | - |
dc.description.abstract | In this work, we focused on investigating the various defects that extend into the near-surface region of CdZnTe (CZT) crystals, and on exploring processing techniques for producing a smooth, non-conductive surface that is ideal for growing thin films and depositing contacts. We determined the surface's features and the chemical species present using atomic-force microscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM), coupled with energy-dispersive spectroscopy. We revealed crystallographic defects, e.g., sub-grains and dislocations on the CZT crystals' surfaces, after employing selected chemical etchants, and then characterized them using optical microscopy, SEM and optical profilometer. Our experimental data imply that the surface defects and chemical species induced by chemical processing may alter the material's interfacial behavior, and ultimately significantly influence the performance of radiation detectors. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER | - |
dc.subject | RADIATION DETECTORS | - |
dc.subject | CRYSTAL-GROWTH | - |
dc.subject | PERFORMANCE | - |
dc.title | Analysis of Defects on Chemically-Treated CdZnTe Surfaces | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, K. -H. | - |
dc.identifier.doi | 10.1007/s11664-015-3742-4 | - |
dc.identifier.scopusid | 2-s2.0-84940438431 | - |
dc.identifier.wosid | 000360311300010 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTRONIC MATERIALS, v.44, no.9, pp.3018 - 3022 | - |
dc.relation.isPartOf | JOURNAL OF ELECTRONIC MATERIALS | - |
dc.citation.title | JOURNAL OF ELECTRONIC MATERIALS | - |
dc.citation.volume | 44 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 3018 | - |
dc.citation.endPage | 3022 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | RADIATION DETECTORS | - |
dc.subject.keywordPlus | CRYSTAL-GROWTH | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordAuthor | CdZnTe | - |
dc.subject.keywordAuthor | substrate and radiation detector | - |
dc.subject.keywordAuthor | dislocations | - |
dc.subject.keywordAuthor | chemo-mechanical polishing | - |
dc.subject.keywordAuthor | metal-semiconductor interface | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.